Control of texture in materials using mtex /matlab at Sandvik

Dr Claes Olsson from Sandvik AB’s Materials Technology division explained at the Matlab expo 2016 how Sandvik has used the MTEX toolbox for analyzing and modeling crystallographic textures by means of pole figure and EBSD data. The software has been integrated into the work of the Materials Technology division allowing an auditable methodology for quality control, meeting standards to supply to their nuclear customers (e.g. in case of rolling zircalloy with controlled texture). Initial example of use was with pole figure data collected with a diffractometer, but they have also used the software to analyse EBSD data.
Screenshot from 2018-06-07 19-42-12
A video of the presentation can be seen here:
Screenshot from 2018-06-07 19-39-32
Slides can be found here:
Mtex is a free toolbox released under the GNU GPL 2, which works inside the commercially available matlab environment.
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MIcroscopes in our time

Sir Colin Humphreys was among the guests on this mornings “In our time” hosted by Melvyn Bragg (Baron Bragg), discussing microscopy.

http://www.bbc.co.uk/programmes/b03jdy3p

Grain Boundary Allotriomorphic Ferrite and Polygonal Ferrite

Bodnar and Hansen (writing in 1994) note that Polygonal ferrite can occur as grain boundary allotriomophs and intragranular idiomorphs. They then demonstrated the similarity between grain boundary allotriomorph and polygonal ferrite  by showing the same grain boundary area at two different magnifications with different labels. In the combined image you can see that the arrow is pointing at very similar position in two figures.

Grain Boundary Allotriomorph in Figure 1 A

 

 

 

 

Polygonal Ferrite Figure 1 B

Polygonal Ferrite in Figure 1 B

 

Posiiton of Figure A in Figure B

Posiiton of Figure A in Figure B

Types of microscopy list

  • X-ray absorption microscopy
  • X-ray tomography
  • Neutron tomography
  • Optical microscopy (reflected, transmitted)
    Polarised light, dark field, DIC, confocal microscopy
  • Acoustic microscopy (used to inspect electronic components for delamination)
  • Electron microscopy (scanning, transmitted)
    OIM, Bright field, dark field, EELS, PEELS, EDX, EDS, tomography
  • Thermionic microscopy
  • Atomic force microscopy (and magnetic force microscopy, and other derivatives)
  • Atom probe microscopy (using inert imaging gas)
  • Tomographic atom probe (evaporation of sample)
  • Positron annihilation (microscopy?)
  • Positron emission tomography
  • Focused Ion beam microscopy
  • Scanning Tunnelling Hydrogen Microscopy

What’s your favourite that I missed?…